UVeye provides high-end solutions for automatic external inspection of vehicles, using advanced technologies that include proprietary hardware combined with machine learning and computer-vision algorithms.
Built for automated design validation, test and measurement, the vehicle radar test system (VRTS) from National Instruments provides automated radar measurement and obstacle simulation capabilities for 76-81GHz vehicular radar systems.
Combining HD4096 12-bit technology and 8GHz bandwidth for low noise and pristine signal fidelity, the WavePro HD high-definition oscilloscopes from Teledyne LeCroy are an industry-first innovation that uniquely support engineers in developing smaller, faster, lower-power mobile and handheld devices including high-speed, deeply embedded computing systems and datacenter technologies.
To successfully simulate entire engine and vehicle operating performance, engineers need a test load box that can send excitation signals required by various sensors as well as the simulated load of the actuators to recreate real-world operating conditions.
Whether it is for development or testing, engineers need components that are perfectly suited to the complete measurement chain, guaranteeing maximum accuracy of measurement results to enable optimization of the complete product lifecycle.
Providing market-leading testing solutions, Dewetron will use Automotive Testing Expo Korea 2019 to display a range of new and established data acquisition technologies, including its GeneSys inertial measurement system, ADMA (automotive dynamic motion analyzer) and the latest version of Stähle’s automated driving robot system for ADAS testing.
Professional vehicle testing requires partners that can provide a range of solutions. CANsystem provides testing solution for all commonly used vehicle bus systems, as well as mobile data acquisition for harsh environments, voltage variation, and electric vehicle test equipment.
Building on the success of the PicoScope 4000 series of high-resolution oscilloscopes, Pico Technology will this year present the improved 4444 model, which now allows high-resolution measurements of differential voltage waveforms.